JPH0363026B2 - - Google Patents
Info
- Publication number
- JPH0363026B2 JPH0363026B2 JP56098048A JP9804881A JPH0363026B2 JP H0363026 B2 JPH0363026 B2 JP H0363026B2 JP 56098048 A JP56098048 A JP 56098048A JP 9804881 A JP9804881 A JP 9804881A JP H0363026 B2 JPH0363026 B2 JP H0363026B2
- Authority
- JP
- Japan
- Prior art keywords
- level
- semiconductor switch
- auxiliary relay
- transistor
- input
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000004065 semiconductor Substances 0.000 claims description 37
- 238000007689 inspection Methods 0.000 claims description 13
- 238000000034 method Methods 0.000 description 10
- 238000010586 diagram Methods 0.000 description 3
- 230000004048 modification Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000001681 protective effect Effects 0.000 description 2
- 238000005070 sampling Methods 0.000 description 2
- 229920006395 saturated elastomer Polymers 0.000 description 2
- 230000008054 signal transmission Effects 0.000 description 2
- 230000005856 abnormality Effects 0.000 description 1
- 230000003213 activating effect Effects 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000001939 inductive effect Effects 0.000 description 1
- 230000007257 malfunction Effects 0.000 description 1
- 238000011084 recovery Methods 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2836—Fault-finding or characterising
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56098048A JPS57211566A (en) | 1981-06-24 | 1981-06-24 | Inspecting circuit for output point of logic sequence circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56098048A JPS57211566A (en) | 1981-06-24 | 1981-06-24 | Inspecting circuit for output point of logic sequence circuit |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS57211566A JPS57211566A (en) | 1982-12-25 |
| JPH0363026B2 true JPH0363026B2 (en]) | 1991-09-27 |
Family
ID=14209287
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP56098048A Granted JPS57211566A (en) | 1981-06-24 | 1981-06-24 | Inspecting circuit for output point of logic sequence circuit |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS57211566A (en]) |
-
1981
- 1981-06-24 JP JP56098048A patent/JPS57211566A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS57211566A (en) | 1982-12-25 |
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